[en] In recent years, knowledge of the different chemical forms of the elements has gained increasing importance. There has been significant progress in methods that hyphenate chromatographic separations with atomic spectrometry. These hyphenated methods can provide the most complete information on the species distribution and even structure. However, they can be lengthy, relatively costly and difficult to bring to the routine. On the other hand, it is important to remember that chromatographic techniques represent only a minor part of the separation procedures available and, in certain cases, the application of basic chemistry to sample treatments can give quantitative information about specific chemical forms. In this sense, non-chromatographic procedures can provide methods that offer sufficient information on the elemental speciation for a series of situations. Moreover, these non-chromatographic strategies can be less time consuming, more cost effective and available, and present competitive limits of detection. Thus, non-chromatographic speciation analysis continues to be a promising research area and has been applied to the development of several methodologies that facilitate this type of analytical approach. In view of their importance, the present work overviews and discusses different non-chromatographic methods as alternatives for the speciation analysis of clinical, environmental and food samples using atomic spectrometry for detection.

[en] A perspective is given of the development and use of surface analysis, primarily by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS), for solving scientific and technological problems. Information is presented on growth and trends in instrumental capabilities, instrumental measurements with reduced uncertainties, knowledge of surface sensitivity, and knowledge and effects of sample morphology. Available analytical resources are described for AES, XPS, and secondary-ion mass spectrometry. Finally, the role of the American Vacuum Society in stimulating improved surface analyses is discussed

[en] Photoemission spectroscopy (PES) has been used widely to study the electronic structure of valence and core levels. However, conventional PES is surface-sensitive. To probe the interface and bulk properties of materials, hard X-ray photoemission spectroscopy (HXPES) has received increasing interest in the last decade, because of the deep probing ability of photoelectrons with higher kinetic energies (2-10 keV). Recently, a HXPES system was developed at the Canadian Light Source, using the high-energy version of a R4000 electron analyzer-based spectrometer connected to a medium-energy beamline, the soft X-ray microcharacterization beamline (SXRMB). Excellent performance of the beamline and the spectrometer is demonstrated herein using Au Fermi and 4f core lines; and the controlled probing depth of HXPES at SXRMB is demonstrated by tuning the photon energy (2-9 keV) in the study of a series of SiO₂/SiC multilayer samples. Combined with the high-resolution X-ray absorption spectroscopy available at the SXRMB, the HXPES offers a powerful nondestructive technique for studying bulk properties of various materials. (author)

[en] Resistance switching phenomena in an amorphous Ni-Ti-O film were investigated. Very clear bipolar resistive switching characteristics were observed with good reproducibility. Stable retention and on/off pulse switching operation was demonstrated. An analysis of x-ray photoelectron spectroscopy of the Ni-Ti-O film provided a clue that the observed unusual bipolar resistance switching in the film is due to a microscopic change in the Ni-O and Ti-O binding states at the Ni-Ti-O film/electrode interface.

[en] Highlights: • The need by industry for small area analysis spurred the advent of the XPS Microprobe. • The Microprobe design allows for rapid x-ray induced secondary electron imaging. • Small areas of interest can quickly be located and analyzed. • Industrial applications include varied types of failure and contamination analyses. • Multipoint depth profiles can be obtained in one acquisition with one sputter crater. - Abstract: We will review the evolution of x-ray photoelectron spectroscopy (XPS / ESCA) instrumentation and applications that led to the development of the scanning XPS microprobe, describe its unique capabilities, and how they have impacted the use of XPS for industrial applications.

[en] X-ray photoelectron spectroscopy (XPS), also called electron spectroscopy for chemical analysis (ESCA), is widely used both in basic research and in analysis of materials, particularly in surface analysis. Using XPS we can obtain information on the elemental surface composition (except for H and He), and the electronic structure of the materials involved. This paper will briefly review the principle of XPS, basic qualitative and quantitative data analysis methods, and some application examples. (authors)

[en] The application of a sufficiently high negative substrate bias, during the growth of tetrahedral amorphous carbon (ta-C), is usually associated with low sp³ bonding configuration and stressed films. However, in an effort to understand and utilize the higher pseudo thermo dynamical conditions during the film growth, at high negative substrate bias (- 300 V), reported here is a study on ta-C films grown under different hydrogen and nitrogen concentration. As grown ta-C films were studied under different negative substrate bias conditions. The variation of the sp³ content and sp³/sp² ratio in the ta-C films exhibits a trend similar to those reported in literature, with a subtle variation in this report being the substrate bias voltage, which was observed to be around - 200 V, for obtaining the highest sp³ (80%) bonding and sp³/sp² (3.95) ratio. The hydrogen and nitrogen incorporated ta-C films studied, at a bias of - 300 V, show an increase in sp³ (87-91%) bonding and sp³/sp² (7-10) ratio in the range of studies reported. The inference is drawn on the basis of the set of data obtained from measurements carried out using X-ray photoelectron spectroscopy, X-ray induced Auger electron spectroscopy and Raman spectroscopy of as grown and hydrogen and nitrogen incorporated ta-C films deposited using an S bend filtered cathodic vacuum arc system. The study indicates the possibility of further tailoring ta-C film properties and also extending capabilities of the cathodic arc system for developing carbon based films for electronics and tribological applications

[en] In this study, the effects of corona plasma process on the dyeability and certain physical properties of woolen fabric were investigated. For this purpose, acid and 1.2 metal complex dyes, which are the most applicable dyes in the wool market were used. The patterns were examined to assess their dyeability, wettability, pilling resistance, alkali solubility, and strength values. The surface morphology and chemical structures were tested by X-ray photoelectron spectroscopy and alkali solubility analyses and also scanned by electron microscopy. Hydrophility indexes of the dyes that were used were determined. With the results of the experiments, their hydrophobic index is of vital importance, which is a factor for plasma efficiency on color depth. By using plasma treatment on woolen fabric, it is achievable to get a product with high hydrophility and pilling resistance values, dyeability, and less burdened dyeing bath.

[en] XAFS and X-ray Photoelectron Spectroscopy (XPS) are element specific techniques used in a great variety of research fields. The near edge regime of XAFS provides information on the unoccupied electronic states of a system. For the detailed interpretation of the XAFS results, input from XPS is crucial. The combination of the two techniques is also the basis for the so called core-hole clock technique. One of the important aspects of photoelectron spectroscopy is its chemical sensitivity and that one can obtain detailed information about the composition of a sample. We have for a series of carbon based model molecules carefully investigated the relationship between core level photoelectron intensities and stoichiometry. We find strong EXAFS-like modulations of the core ionization cross sections as function of photon energy and that the intensities at high photon energies converge towards values that do not correspond to the stoichiometric ratios. The photoelectron intensities are dependent on the local molecular structure around the ionized atoms. These effects are well described by molecular calculations using multiple scattering theory and by considering the effects due to monopole shake-up and shake-off as well as to intramolecular inelastic scattering processes.

[en] X-ray photoelectron spectroscopy (XPS) is a quantitative surface analysis technique used to identify the elemental composition, empirical formula, chemical state, and electronic state of an element. The kinetic energy of the electrons escaping from the material surface irradiated by an x-ray beam produces a spectrum. XPS identifies chemical species and quantifies their content and the interactions between surface species. It is minimally destructive and is sensitive to a depth between 1-10nm. The elemental sensitivity is in the order of 0.1 atomic %. It requires ultra high vacuum ((Formula presented.) Pa) in the analysis chamber and measurement time varies from minutes to hours per sample depending on the analyte. XPS dates back 50 years ago. New spectrometers, detectors, and variable size photon beams, reduce analysis time and increase spatial resolution. An XPS bibliometric map of the 10 000 articles indexed by Web of Science[1] identifies five research clusters: (i) nanoparticles, thin films, and surfaces; (ii) catalysis, oxidation, reduction, stability, and oxides; (iii) nanocomposites, graphene, graphite, and electro-chemistry; (iv) photocatalysis, water, visible light, and TiO₂; and (v) adsorption, aqueous solutions, and waste water. (author)