[en] This bibliography, covering the period 1993, includes references related to the following topics: atom probe field ion microscopy (APFIM), field emission (FE), and field ion microscopy (FIM). Technique-oriented studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references are listed alphabetically by authors, an Addendum of references missed in previous bibliographies is included

[en] FIM observation has revealed that the atomic arrangement of a monoatomic Ga layer on the W and Mo(011) plane is the (3 x 3) superstructure formed by zigzag chains of Ga atoms. Observed images indicate that the Ga atoms of the zigzag chains are displaced in the [01^-1] or [011^-] direction from an open W lattice site to the position where the displaced atom is stabilized by contacting three substrate W atoms. (Auth.)

[en] A review of the progress made in the last years in FIM application to thin film structure studies and adatom properties important in the nucleation stage of thin film growth: substrate binding and mobility of individual adatoms, behaviour of adatoms clusters is presented. (author)

[en] Thorium metal (fec) is potentially useful in nuclear reactor technology, and is the object increasing scientific interest. Thorium has not previously been imaged with either field ion or field electron microscopy. Since field ion microscopy (FIM) is capable of resolving structures such as lattice steps, vacancies, impurities, dislocations, etc. on an atomic scale, the application of FIM to thorium provides an important investigative technique. We describe here a method of preparing and imaging thorium specimens. (orig.)

[en] Using a field ion microscope (FIM) the inter-atomic interaction between tungsten and tungsten, and tungsten and rhenium was investigated

[en] In accordance with the present invention there is disclosed a field emission gun including means for improving the signal to noise ratio recoverable from a charged particle beam which may be generated within the gun by the minimization of the accelerating of secondary electrons generated within the gun by the beam. The gun includes a vacuum chamber having disposed therein an electron source having a tip, a first anode spaced downstream of the tip, and a second anode spaced downstream of the first anode and voltage means connected to the first and second anodes for supplying electrical potential to establish between the anodes, focus and accelerating field to form a beam of electrons emanating from the source

[en] Using a field ion microscope (FIM) the inter-atomic interaction between tungsten and tungsten, tungsten and rhenium was investigated. (author)

[en] There have been efforts since the introduction of field ion microscopy (FIM) to extend its application to various metals, alloys and semiconductors. Curiously, no FIM study of zirconium has been published even though zirconium micrographs have existed for some time. In view of the large interest in the metal a method of preparing and imaging Zr specimens in the field ion microscope is reported. (Auth.)

[en] A review of selected results of surface self-diffusion and heterogeneous surface diffusion measurements is presented. Experiments utilizing the field ion microscope (FIM), usually confined to a low-temperature regime, are compared to macroscopic experiments carried out at high temperature. Certain intrinsic differences between these two approaches are pointed out during the discussion of results. A more self-consistent picture of microscopic and macroscopic (thermodynamic) surface variables appears to be necessary in order to arrive at a uniform understanding of all experiments. In this context, the role of surface defects, such as steps, kinks, etc., are discussed in detail. In the range of macroscopic variables, the energy of formation of surface defects, ΔH/sup f/, is experimentally still not available, and as such a missing link between FIM and mass transfer measurements. Possible experiments for obtaining ΔH/sup f/ are suggested. 15 fig., 82 references

[en] The features of the field ion microscope designed and fabricated by the Bhabha Atomic Research Centre, Bombay are described. Its uses are mentioned. (M.G.B.)