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AbstractAbstract
[en] There are about 60 contributions on various applications of micro-electronics. Three of them are in INIS scoping, dealing with radiation measuring instruments. 234 figs. (qui)
Original Title
Mikroelektronik 87
Source
1987; 505 p; Springer-Verlag; Vienna (Austria); Microelectronics '87; Vienna (Austria); 14-16 Oct 1987; ISBN 3-211-82023-X; 
; ISBN 0-387-82023-X;
; ISBN 0-387-82023-X; Record Type
Book
Literature Type
Conference
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Oswalt, J.A.
Sandia Labs., Albuquerque, N.Mex. (USA)1975
Sandia Labs., Albuquerque, N.Mex. (USA)1975
AbstractAbstract
[en] Hybrid circuit applications for nuclear weapons have been considered at Sandia since the mid-60's. However a major commitment was made in 1970 to develop a limited but well understood set of technologies for weapon applications. Development of these technologies and related studies have been documented in a number of publications. This bibliography lists the publications from 1968 to mid-1977 for reference by hybrid designers, users, or technologists
Primary Subject
Source
Dec 1975; 91 p; Available from NTIS., PC A05/MF A01
Record Type
Report
Literature Type
Bibliography
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] A circuit is described which may be used as a basis for either a summer or a subtracter decade counter in the 1-2-4-8 code. Joint employment of forward and reverse counting decades makes it possible to develope a reversive counter. Basic circuits of the decade itself and of the summer counter, the subtracter counter and the reversive decimal counter are given. All these devices use integrated circuits of the 155 and 158 series
Original Title
Universal'nyj dekadnyj schetchik na integral'nykh mikroskhemakh
Source
For English translation see the journal Instruments and Experimental Techniques (USA).
Record Type
Journal Article
Journal
Pribory i Tekhnika Ehksperimenta; ISSN 0032-8162; ; (no.1); p. 138-141
; (no.1); p. 138-141
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] The invention concerns the NMR radiospectrometry. The device suggested consists of control voltage source, integrating elements, balance amplifier and commuting switch. To simplify the design and to simultaneously provide for the NMR signal phase regulation, a balance comparator, a stabilizer, a standart voltage amplitude regulator and a phase regulator comparator are introduced into the device. The device ensures smooth NMR signal phase regulation in the range of 180 deg
Original Title
Ustrojstvo dlya chastotnoj razvertki radiospektrometra yadernogo magnitnogo rezonansa
Source
15 Jul 1975; 3 p; SU PATENT DOCUMENT 543865/A/
Record Type
Patent
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] Full text: Scaling of semiconductor technology (CMOS) has been the driving force for the success of information technology. However, as device dimensions continue to shrink into the nanometer length-scale regime, conventional semiconductor technology will be approaching fundamental physical limits. New strategies, including the use of novel materials and 1D-device concepts, innovative device architectures, and smart integration schemes need to be explored and assessed. They are crucial to extend current capabilities and maintain momentum beyond the end of the technology roadmap time frame (post-CMOS era). (author)
Primary Subject
Source
Briegel, H. (Physics Department of the University of Innsbruck, Innsbruck (Austria)); Gornik, E. (Austrian Physical Society (Austria)); Rossel, C. (Swiss Physical Society (Switzerland)); Schindler, S. (Austrian Society of Astronomy and Astrophysics (Austria)) (eds.); Oesterreichische Physikalische Gesellschaft (Austria); Swiss Physical Society (Switzerland); Oesterreichische Gesellschaft fuer Astronomie und Astrophysik (Austria). Funding organisation: Federal Ministry for Science and Research (Austria); Federal Ministry for Traffic, Innovation and Technology (Austria); Province of the Tyrol (Austria); City of Innsbruck (Austria); University of Innsbruck (Austria); Swiss Academy of Sciences (Switzerland); Swiss Academy of Engineering Sciences (Switzerland); 254 p; 2009; p. 35; Joint annual meeting of the Austrian physical society, Swiss physical society, Austrian society of astronomy and astrophysics; Gemeinsame Jahrestagung der Oesterreichischen Physikalischen Gesellschaft, der Schweizer Physikalischen Gesellschaft, der Oesterreichischen Gesellschaft fuer Astronomie und Astrophysik; Innsbruck (Austria); 2-4 Sep 2009; Available in abstract form only, full text entered in this record. Available from: http://oepg2009.uibk.ac.at/
Record Type
Miscellaneous
Literature Type
Conference
Country of publication
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue
External URLExternal URL
Schantz, L.E.
Bendix Corp., Kansas City, Mo. (USA)1976
Bendix Corp., Kansas City, Mo. (USA)1976
AbstractAbstract
[en] Efforts were undertaken to study and select fabrication methods suitable for processing multiple hybrid microcircuits (HMCs) on 3.75- by 4.5-in. (95 by 114 mm) substrates through thin-film metallization and photolithography. Each fabrication method studied was based on its potential for multiple hybrid microcircuit processing. Thin-film deposition parameters were analyzed in terms of thin-film properties necessary to meet HMC electrical and component attachment requirements, and photolithography parameters were analyzed in terms of dimensional requirements on the circuit pattern. The objective of this effort was met, and the techniques developed are being used successfully in the production of multiple HMCs
Primary Subject
Source
Jan 1976; 50 p; Available from NTIS; Available from NTIS. $4.00.
Record Type
Report
Literature Type
Progress Report
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] Modern Large Scale Integration (LSI) microcircuits are meant to be programmed in order to control the function that they perform. In the previous paper the author has already discussed the basics of microprogramming and have studied in some detail two types of new microcircuits. In this paper, methods of developing software for these microcircuits are explored. This generally requires a package of support software in order to assemble the microprogram, and also some amount of support software to test the microprograms and to test the microprogrammed circuit itself. (Auth.)
Source
Verkerk, C. (ed.); European Organization for Nuclear Research, Geneva (Switzerland); p. 50-64; 28 Nov 1978; p. 50-64; 1978 CERN school of computing; Jadwisin, Poland; 28 May - 10 Jun 1978
Record Type
Report
Literature Type
Conference
Report Number
Country of publication
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue
Oswalt, J.A.
Sandia Labs., Albuquerque, N.Mex. (USA)1975
Sandia Labs., Albuquerque, N.Mex. (USA)1975
AbstractAbstract
[en] Sandia originated documents (94) describing aspects of technology development related to hybrid microcircuits and thin films are summarized. Authors, titles, and abstracts are given for each unclassified document. The papers are categorized according to the various technologies involved in hybrid microcircuit production
Primary Subject
Secondary Subject
Source
Dec 1975; 61 p; Available from NTIS; Available from NTIS. $4.50.
Record Type
Report
Literature Type
Bibliography
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Gehman, R.W.
Bendix Corp., Kansas City, MO (USA)1981
Bendix Corp., Kansas City, MO (USA)1981
AbstractAbstract
[en] A literature search was conducted to support development of in-house diagnostic testing of thick film materials for hybrid microcircuits. A background literature review covered thick film formulation, processing, structure, and performance. Important material properties and tests were identified and several test procedures were obtained. Several tests were selected for thick film diagnosis at Bendix Kansas City. 126 references
Original Title
Hybrid microcircuits
Primary Subject
Secondary Subject
Source
Sep 1981; 27 p; Available from NTIS., PC A03/MF A01
Record Type
Report
Literature Type
Bibliography
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Shepherd, J.T.
Abertay Univ., Dundee (United Kingdom)1998
Abertay Univ., Dundee (United Kingdom)1998
AbstractAbstract
No abstract available
Primary Subject
Source
Feb 1998; [vp.]; Available from British Library Document Supply Centre- DSC:DXN016581; Thesis (Ph.D.)
Record Type
Miscellaneous
Literature Type
Thesis/Dissertation
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
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