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Rabah, K.V.O.
International Centre for Theoretical Physics, Trieste (Italy)
International Centre for Theoretical Physics, Trieste (Italy)
AbstractAbstract
[en] Threshold switching between two impedance states have been observed at room temperature in a polymethylmethacrylate (PMMA) thin film sandwiched between two evaporated Al-metal electrodes. The cell's I-V characteristics were found to exhibit memory property. (author). 19 refs, 4 figs
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May 1995; 10 p
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Bajramov, R.K.
Physicochemistry of ultrafine (nano-) systems. Materials of X All-Russian Conference and Russian youth scientific school
Physicochemistry of ultrafine (nano-) systems. Materials of X All-Russian Conference and Russian youth scientific school
AbstractAbstract
No abstract available
Original Title
Dispergirovanie v impul'snykh razryadakh metallov, obrazuyushchikh na poverkhnosti oksidnye plenki s nizkim kontaktnym soprotivleniem
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Source
Rossijskij Fond Fundamental'nykh Issledovanij, Moscow (Russian Federation); Ministerstvo Obrazovaniya i Nauki Rossijskoj Federatsii, Moscow (Russian Federation); Rossijskaya Akademiya Nauk, Moscow (Russian Federation); Nanotekhnologicheskoe Obshchestvo Rossii, Moscow, Zelenograd (Russian Federation); RNTs Kurchatovskij Inst., Moscow (Russian Federation); Yuzhnyj Federal'nyj Univ., Rostov-na-Donu (Russian Federation); NKTB P'ezopribor YuFU, Rostov-na-Donu (Russian Federation); 138 p; ISBN 978-5-9275-0997-3;
; 2012; p. 23-24; 10. All-Russian conference and Russian youth scientific school on physicochemistry of ultrafine (nano-) systems; Fizikokhimiya ul'tradispersnykh (nano-) sistem. X Vserossijskaya konferentsiya i Rossijskaya molodezhnaya nauchnaya shkola; Anapa (Russian Federation); 25-29 Sep 2012; 3 refs., 1 fig.

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AbstractAbstract
[en] The dependence of current on polarization is studied in the photoemission from the heterostructure of GaAs-(Al Ga)As in an electrostatic uniform external field in case of a slight doping of a p-type GaAs film. The photocurrent emission intensity is estimated as a function of the emitted electron beam polarization. For an electron beam with ρ=0,8 polarization, the emission current density can reach Ie∼10-3 A/cm2. It is shown that there are imposed upper restrictions on the light intensity, and lower restrictions on the acceptor density. 11 refs
Original Title
Otsenka plotnosti toka pri fotoehmissii ehlektronov vysokoj polyarizatsii iz geterostruktury GaAs-(AlGa)As v ehlektrostaticheskom odnorodnom vneshnem pole
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1991; 21 p
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AbstractAbstract
No abstract available
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(c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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Profeti, Demetrius; Profeti, Luciene P.R.; Olivi, Paulo, E-mail: demetrius.profeti@ufes.br
AbstractAbstract
[en] Highlights: • The electrochemical synthesis of poly(o-methoxyaniline) (POMA) thin films was performed. • The concentration of monomer, and anodic charge influence the POMA film formation. • A relationship between the mass of the POMA, the anodic charge, and concentration of the OMA was established by EQCM studies. • The morphology of the films shows a compact first layer with spherical grains of different sizes distributed in this layer.
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S0254058418302451; Available from http://dx.doi.org/10.1016/j.matchemphys.2018.03.075; Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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AbstractAbstract
[en] Information storage polymers have been described and used for many years. When using an electron beam to store information, chemical changes in the macromolecules via local radiation damage is utilized to print the information into the polymer. This letter reports the writing of optically detectable information into birefringent polymer films. The method is based on the fact that preferred orientation of the macromolecules can be destroyed by electron radiation damage. The damage is produced by an electron beam in a transmission electron microscope. The resulting information is observed optically in a polarizing microscope. The polymer films used in the present study were polybutene 1 (PB 1), polyethylene (PE) and polyvinyl-idenfluoride (PVDF). (author)
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AbstractAbstract
No abstract available
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Available from http://dx.doi.org/10.1070/PU1998v041n10ABEH000467; Abstract only; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
Journal
Physics Uspekhi; ISSN 1063-7869;
; v. 41(10); p. 1045-1046

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Knez, Mato, E-mail: m.knez@nanogune.eu
AbstractAbstract
[en] Atomic layer deposition (ALD) is a mature technology for the deposition of conformal thin films. During the ALD process or in a post-treatment, a variety of diffusion phenomena can occur which can not only deteriorate the desired product, but also can be used to fabricate materials or structures in a novel way. This special issue reviews some of the observed diffusion processes and strategies to make use of those. (paper)
Source
Available from http://dx.doi.org/10.1088/0268-1242/27/7/074001; Country of input: International Atomic Energy Agency (IAEA)
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AbstractAbstract
[en] We study the impact of a drop of liquid onto a thin layer of the same liquid. We give an overview of the sequence of events that occur as the two most important dimensionless control parameters are varied. In particular, multiple cohorts of droplets can be ejected at different stages after impact due to different mechanisms. Edgerton's famous Milkdrop Coronet is only observed for a narrow range of parameters. Outside this range, the splash is either qualitatively different, or suffers from a much lower level of regularity. (cover illustration)
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Source
S0951-7715(08)62673-0; Available from http://dx.doi.org/10.1088/0951-7715/21/1/C01; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
Journal
Nonlinearity (Print); ISSN 0951-7715;
; v. 21(1); p. C1-C11

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AbstractAbstract
[en] Published in summary form only
Original Title
Filmes finos eletrocromicos: producao e caracterizacao
Primary Subject
Source
Almeida Fonseca, A.L. de (Brasilia Univ., DF (Brazil)); Koiler, B. (Pontificia Univ. Catolica do Rio de Janeiro, RJ (Brazil)); Brescansin, L.M. (Universidade Estadual de Campinas, SP (Brazil)) (and others); Sociedade Brasileira de Fisica, Rio de Janeiro, RJ (Brazil); 284 p; 1990; p. 263; 13. National Meeting on Condensed Matter Physics; Caxambu, MG (Brazil); 8-12 May 1990; Available from the Library of the Comissao Nacional de Energia Nuclear, RJ, Brazil
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