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Schneider, D.
Thirteenth international conference on the application of accelerators in research and industry1994
Thirteenth international conference on the application of accelerators in research and industry1994
AbstractAbstract
[en] The retrapping of highly charged Xe44+ and Th68+,72+ ions extracted from an open-quotes Electron Beam Ion Trapclose quotes (EBIT) is demonstrated after injection of the ions into RETRAP, a cryogenic Penning trap (up to 6 Tesla magnetic field) currently with an open cylinder design. Ion extraction in a short pulse (5-20 μsec) from EBIT, essential for efficient retrapping, is employed. The ions are slowed down upon entering a deceleration tube mounted above the trap within the magnetic field. The potential is then rapidly (100 ns) decreased, enabling low energy ions to enter the trap. Capture efficiencies up to 25% are observed via detection of the delayed ion release pulse with a detector below the trap. Signal voltages induced in a tuned circuit due to single and multiple ions have been observed by tuning the ion resonant axial oscillation frequencies for different ions. Results from transporting and retrapping of the ions, as well as their detection, are described and the trapping efficiency is discussed, The motivation for these studies is to cool the trapped very highly charged ions to low temperatures (< 4 K) in order to perform ultrahigh resolution precision spectroscopy, collision studies at ultra low energies and to observe phase transitions in Coulomb clusters of highly charged ions
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Duggan, J.L.; Morgan, I.L. (eds.); 201 p; 1994; p. 27-28c; University of North Texas; Denton, TX (United States); 13. international conference on the application of accelerators in research and industry; Denton, TX (United States); 7-10 Nov 1994
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[en] We have observed the variation in ion signal as a function of intensity within a focused laser spot. Using an aperture detector, the ion signals from narrow bands of the laser focus have been observed. By moving the laser focus along the direction of propagation, regions of different intensities are exposed to the detector. This has allowed detailed measurements to be made of ion signals as a function of laser intensity. (orig.)
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HCI 2000: 10. international conference on the physics of highly charged ions; Berkeley, CA (United States); 30 Jul - 3 Aug 2000
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Physica Scripta. T; ISSN 0281-1847;
; v. 92; p. 119-121

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[en] Xe ions accelerated for the first time at the Nuclotron-M were identified. The dependence of the track length of ions in a substance on their energy was used to solve this problem. The measurements were carried out at the Nuclotron-M upon the acceleration of 124Xe42+ ions. The detecting part was located on the beam ejection and consisted of ΔE and E detectors. The experimental and simulation data using the GEANT program are presented.
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Available from http://link.springer.com/openurl/pdf?id=doi:10.1134/S1547477111020026; Copyright (c) 2011 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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Physics of Particles and Nuclei Letters (Print); ISSN 1547-4771;
; v. 8(2); p. 114-118

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AbstractAbstract
[en] The NIST Electron Beam Ion Trap (EBIT) has been modified to be used as a source of low kinetic energy, highly-charged ions. It can produce, for example, a continuous beam of Xe44+ ions with more than a million counts per second or 7 pA. This beam has been used to bombard surfaces such as mica, CR-39 (polymer) and self-assembled monolayers. The authors characterized the surfaces using techniques including AFM and SEM, and observed single-ion features approximately 15 nm in diameter
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27. annual meeting of the Division of Atomic, Molecular and Optical Physics (DAMOP) of the American Physical Society (APS); Ann Arbor, MI (United States); 15-18 May 1996; CONF-9605105--
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[en] Lifetimes of seven levels belonging to the 5p46d configuration of Xe II have been measured by high frequency deflection technique with a delayed coincidence single photon counting arrangement. The results have been compared with other experimental and theoretical values. (orig.)
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[en] Lifetimes of ions confined by a radio frequency quadrupole field in the presence of a buffer gas are measured. The results are in good agreement with a hard sphere collision model
[fr]
On mesure la duree de vie d'ions Xenon confines par un piege quadrupolaire en fonction de la densite d'un gaz tampon. Les resultats sont en accord avec un modele theorique de collision a spheres duresOriginal Title
Influence d'un gaz tampon sur la duree de vie d'ions confines
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Journal Article
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J. Phys. (Paris), Lett; v. 37(12); p. L.339-L.340
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[en] The secondary electron yields as a result of highly charged ions impinging on clean Au(111) and thin films of C60 on Au have been measured. This has been done for film thicknesses of one to five monolayers and several charge states of Ar and Xe ions. For all ions an increase of 35% in the secondary electron yield is observed when going from Au(111) to multiple C60 layers. The increase remains constant for a wide range (7-26) of charge states. Possible scenarios are given to explain the increase in electron yield.
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(c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
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Rosandi, Yudi; Urbassek, Herbert M., E-mail: urbassek@rhrk.uni-kl.de2017
AbstractAbstract
[en] Using molecular-dynamics simulation, we study the impact of 0.5 keV Xe ions at glancing incidence (80° from the surface normal) on a graphene flake supported on a (0 0 0 1) graphite substrate. The step forming at the ascending edge of the flake allows the entrance of glancing-incidence ions into a subsurface channel between graphene layers. We find that subsurface-channeled ions have a high probability to lift the flake off the substrate, while non-channeled projectiles rather damage the flake leading eventually to welding the flake to the substrate by the formation of sp3 bonds.
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IBMM 2016: 20. international conference on ion beam modification of materials; Wellington (New Zealand); 30 Oct - 4 Nov 2016; S0168583X17304329; Available from http://dx.doi.org/10.1016/j.nimb.2017.04.011; Copyright (c) 2017 Elsevier B.V. All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 409; p. 111-115

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[en] We present a revised analysis of the spectrum of singly ionized xenon, Xe II. This spectrum has been reanalyzed on the basis of the wavelength material published by Drs J. C. Boyce and C. J. Humphreys. The latter has kindly placed the original wavelength list covering the wavelength range 10220-390 A at our disposal. We report 161 energy levels which have been identified on the basis of classifications of 950 lines. We report first f and g levels in Xe II. Also a number of g-factors have been determined for the first time and we give in total 75 g-factors. We have carried out least-squares fits to the even configurations and report the resulting parameter values and eigenvector compositions. A least-squares fit to the 5p46p configuration is also reported. The levels have been named in jK and for many levels also in LS coupling. The former is the better coupling scheme for Xe II. We present an analysis of the 5s photoelectron satellite spectrum of Xe based on our calculated eigenvector compositions and calculations of transition probabilities for ground state transitions as well as lifetimes for the 6p levels. The latter are compared to recent experimental measurements. A list of wavelengths for observed laser transitions showing the present classifications and a discussion of the determination of the ionization potential of Xe II concludes the paper. (orig.)
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Schinca, D.; Duchowicz, R.; Gallardo, M.
International Centre for Theoretical Physics, Trieste (Italy)1992
International Centre for Theoretical Physics, Trieste (Italy)1992
AbstractAbstract
[en] Visible and UV laser emission from a highly ionized pulsed Xe plasma was studied in relation to the ionic assignment of the laser lines. Time-resolved spectroscopy was used to determine the ionic origin of the studied lines. The results are in agreement with an intensity versus pressure analysis performed over the same wavelength range. From the temporal behaviour of the spontaneous emission, a probable classification can be obtained. (author). 7 refs, 7 figs, 1 tab
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LAMP series report (Laser, Atomic and Molecular Physics); Dec 1992; 13 p
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