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AbstractAbstract
[en] An overview is given of some projects which (1) have used surface analytical techniques in a conventional way to investigate specific surface-related problems; (2) have utilized surface studies to get a more fundamental understanding of the operations of various devices and components, and of the factors that determine such parameters as the lifetime and reliability of such devices; and (3) have been undertaken to better understand just what additional information can be extracted from two of the myriad surface analytical techniques, Auger electron spectroscopy (AES) and electron-stimulated desorption (ESD). The examples in the first two categories are directly related weapons work while the examples discussed in the third category provide more general support to weapons programs. Only work in the first category is tabulated. Two examples of work in the second category are the neutron generator project and the design and production of integrated circuits (IC). Tritide-film targets in neutron generator tubes lose their efficiency for neutron production when they have adsorbed surface contaminants such as oxygen. Ion microprobe analysis has been applied to the study of contaminants on and in these films; and thermal desorption spectroscopy has been used to identify, and to determine the binding energy of gases evolved during outgassing of materials used in tube construction. Long-term outgassing determines the lifetime of the vacuum tubes. AES serves as the common thread in the third category projects. Gas phase, core-valence-valence (CVV) Auger lines have been measured in a systematic attempt, utilizing both theory and experimental results, to determine the factors that influence the shapes of the lines. This work demonstrates the local nature of the information on the energy distribution of valence levels contained in the Auger lineshapes
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Source
1978; 23 p; 8. conference on surface studies; Aiken, SC, USA; 9 - 11 May 1978; CONF-780562--2; Available from NTIS., MF A01
Record Type
Report
Literature Type
Conference
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INIS VolumeINIS Volume
INIS IssueINIS Issue