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AbstractAbstract
[en] A method and apparatus for measuring the degree of quench in a liquid scintillation sample by irradiating the sample with a standard source, such as a cesium-137 gamma source, to produce a Compton scattered electron distribution exhibiting a Compton edge configuration as the leading edge are described. For increasing the quench levels in the sample, the Compton edge shifts to lower pulse height values and the extent of this shift is indicative of the degree of quench. To measure the degree of quench, a unique point on the Compton edge, namely the point at which the second derivative of the edge is zero (i.e. the inflection point), is measured for the quenched sample and the pulse height value corresponding to the inflection point is determined. The pulse height value is compared with the pulse height value determined for a calibration standard in a similar manner, the difference in pulse height values indicating the degree of quench
Original Title
Patent
Source
21 Feb 1978; 20 p; US PATENT DOCUMENT 4,075,480/A/
Record Type
Patent
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