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Langley, R.A.; Blewer, R.S.; Roth, J.
Sandia Labs., Albuquerque, NM (USA); Max-Planck-Institut fuer Plasmaphysik, Garching (Germany, F.R.)1978
Sandia Labs., Albuquerque, NM (USA); Max-Planck-Institut fuer Plasmaphysik, Garching (Germany, F.R.)1978
AbstractAbstract
[en] The behavior of deuterium and helium implanted near room temperature at 8 keV into prism plane oriented graphite was studied as a function of implantation fluence and post-anneal temperature. Depth profiles of the implanted species were measured by proton backscattering. Quantitative thermal desorption measurements were performed to study the species emitted from the sample during ramp heating to 9500C
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1978; 27 p; 3. conference on plasma surface interaction in controlled fusion devices; Culham, UK; 3 - 7 Apr 1978; CONF-780467--5; Available from NTIS., PC A03/MF A01
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