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McKinney, J.T.; Goff, R.F.
Minnesota Mining and Mfg. Co., St. Paul (USA)1976
Minnesota Mining and Mfg. Co., St. Paul (USA)1976
AbstractAbstract
[en] An apparatus is described for analysing the surface of a substance. It includes a primary ion beam generator; a system to direct the beam along a pre-set path so that it will hit the surface pf the substance to be analysed so that it is diffused by it; a system for transmitting ions representative of the atoms of the surface and having a given mass; and a device to receive the ions transmitted and transform the ions received into an electronic signal characteristic of the surface atoms
[fr]
On decrit un appareil d'analyse de la surface d'une matiere. Il comprend un generateur d'un faisceau d'ions primaires; un dispositif destine a diriger le faisceau suivant un trajet predetermine afin qu'il vienne frapper la surface de la matiere a analyser et que celle-ci le diffuse; un dispositif destine a transmettre des ions representatifs des atomes de la surface et ayant une masse donnee; et un dispositif destine a recevoir les ions transmis et a transformer les ions recus en un signal electronique caracteristique des atomes de la surfaceOriginal Title
Procede et appareil d'analyse de la surface d'une matiere par diffusion d'ions
Primary Subject
Source
25 Jun 1976; 19 p; FR PATENT DOCUMENT 2317650/A/; Available from Institut National de la Propriete Industrielle, Paris (France); Priority claim: 27 Jun 1975, US.
Record Type
Patent
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