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AbstractAbstract
[en] Nonconventional techniques for measuring thickness are reviewed. The techniques include x-ray fluorescence, photon attenuation, radiation gages with magnetic source-detector alignment, and ultrasonics
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Source
Schuman, J.F. (comp.); California Univ., Livermore (USA). Lawrence Livermore Lab; p. 14; 1978; p. 14; 37. nonconvertional metrology meeting; Livermore, CA, USA; 17 - 19 Apr 1978
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Conference
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