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AbstractAbstract
[en] Two modifications of the classical method of X-ray spectrometry by a semi-conductor diode permit a count rate of 105 c/s with an energy resolution of 350 eV. With a specially constructed pulse height analyzer, this detector can measure four spectra of 5 ms each, in the range of 1-30 keV, during a plasma shot
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Jun 1978; 17 p
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