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AbstractAbstract
[en] Scanning and transmission electron microscopy, microprobe (electron, nuclear and Auger) analysis, X-ray diffraction and ferrography are applied to a wide range of problems of interest to the UKAEA. These include: the preparation of transistors, the coating of bearings, component reliability, the microstructure and behaviour of type 316 and other steels, the examination of the surface layers of various ceramics, steels and other alloys, as well as the corrosion of steels and Zircaloy. (author)
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Source
Feb 1979; 118 p; UKAEA diffraction analysis conference. 25. (Jubilee) meeting; Warrington, UK; 4 - 6 Oct 1977; Also available from H.M. Stationery Office, price Pound2.50
Record Type
Report
Literature Type
Conference
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