[en] Element composition, macrostresses in polycrystalline chromium films are investigated by methods of X-ray diffractometry and back scattering of ⁴He⁺⁺ nuclei. Chromium evaporation of 99.98% purity was carried out by heating with an electron beam and resistive heater. Films were condensated on glass substrates heated up to 200 deg C in helium and oxygen residual atmosphere. In condensates, obtained at approximately 10^-3 - 10² mm Hg helium pressure a more perfect structure and decrease of tensile stress level are observed, as compared with condensates, obtained in pure cryogenic vacuum. Non-uniform stressed state, connected with non-uniformity of oxygen distribution within condensate, is characteristic of films, obtained in oxygen medium. Tensile stresses occur in the films of this series as a result of homogenizing annealing at 350 deg C during 9 h. The coefficient of oxygen adhesion on the growing chromium layer is equal to 0.54-0.4