Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.013 seconds
AbstractAbstract
[en] A method for quantitatively measuring one or more elements in a sample is claimed. The method comprises combining the results of (i) a measurement of neutron inelastic scatter γ rays over a selected volume of the sample and (ii) a measurement of γ ray scatter over the selected volume. Measuring apparatus for quantitatively measuring the concentration of an element in a sample is also claimed. The apparatus comprises a neutron inelastic scatter assembly, a γ ray scatter assembly and means to calculate the concentration from the outputs of the assemblies. The neutron inelastic scatter assembly comprises a source yielding neutrons having energy sufficient to produce inelastically scattered γ rays from a stable isotope of the element, a γ detector and a shield means. The γ ray scatter assembly comprises a γ source, γ detector and a shield means
Primary Subject
Secondary Subject
Source
28 May 1981; vp; AU PATENT DOCUMENT 78/39253/B/; Copies available from the Commissioner of Patents, Canberra; Filed 18 May 1978.
Record Type
Patent
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue