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AbstractAbstract
[en] The electron diffusion gives local information about the structure of amorphous samples. The interference functions obtained from rough corrected diagrams are compared with those given by a filtered one, corresponding only to elastically diffused electrons. This last method is used to study the evolution of the structure of annealed metglas. (author)
Original Title
Functions d'interferences electroniques filtres d'echantillons amorphes
Source
Fe40Ni38Mo4B18, Fe80B20.
Record Type
Journal Article
Journal
Physica Status Solidi. A, Applied Research; ISSN 0031-8965;
; v. 63(2); p. 631-636

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