[en] A simple method has been developed for the elimination of charging, and for accurate beam current/charge measurement, when thick insulating samples are being analysed by PIXE. This technique involves simply placing a thin foil of a suitable material, (e.g. C, Al, Ni, Au, Au on C, etc.), 1-2 cm in front of the target, and monitoring the backscattered particles from it with a surface barrier detector. The incident beam of charged particles produces a sufficient number of electrons in the forward direction, from this foil, to neutralize the positive charge accumulating on the thick insulating target. At the same time the backscattered particles from this foil, as monitored by the detector which is completely shielded from the target, give an accurate measure of the incident current/charge. The effectiveness of this method of charge elimination has not only been demonstrated by vast improvement in the PIXE spectra, but also by the resonance shift method in the yield curves of the ¹⁹F(p,αγ)¹⁶O reaction from a thick insulating CaF₂ target. It is suggested that this foil technique would be equally well suited to other ion-beam analysis work. (orig.)