[en] Diffusion profiles have been measured for silver in hollow and solid cylinders in the temperature range 490 to 800⁰C. The profiles show two components of diffusion. There is a high concentration, relatively immobile zone near the surface and a low concentration, rapidly moving component deeper into the sample. The rapid component is well fitted by the diffusion equation when irreversible trapping is assumed. The diffusion coefficients determined by least-square analysis of the profiles can be represented by D (m²/sec) = 17.4 exp (-22,100/T). Excessive scatter was seen in the trapping coefficients determined from the profiles. This is believed to be due to varying amounts of impurities in the different samples. A limited number of desorption measurements were performed for silver from H-451 graphite. Evidence of Elovich-type behavior was noted