[en] The radioisotope source-target assembly for exciting X-ray fluorescence iX-ray fluorescence analysis is described. It is based on ²⁴¹Am of great activity. Si(Li)semiconductor detector has been used for the measurements. The developed system allows one to increase appreciably the yield of secondary X-ray fluorescence. Using barium target analysis sensitivity down to 0.0001-0.0004% for silver in geological samples has been achieved, and using cadmium target sensitivities down to 0.1% for Fe, 0.O6% for Ni and 0.001% for Mo in 10 min measurement have been achieved