Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.016 seconds
Zuhr, R.A.; Roberto, J.B.; Withrow, S.P.
Oak Ridge National Lab., TN (USA)1981
Oak Ridge National Lab., TN (USA)1981
AbstractAbstract
[en] It was shown that metallic impurity fluxes to the wall are far lower (x 3000) than those to limiter-like probes located 2 cm outside the limiter radius. Deuterium fluxes are also lower (x 10) at the wall position and are in reasonable agreement with single crystal silicon damage data. Finally, both wall and limiter position data are consistent with an impurity introduction model in which charge exchange neutral sputtering of the wall is the dominant introduction mechanism
Primary Subject
Source
1981; 6 p; American Vacuum Society national symposium; Anaheim, CA (USA); 3 - 6 Nov 1981; Available from NTIS., PC A02/MF A01 as DE82004062
Record Type
Report
Literature Type
Conference
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue