[en] An equivalent beam averaging (EBA) procedure is described which has proved to be very useful to enhance I-V profile data collected for LEED analyses. Specific analyses are documented where application of EBA has led to improved agreement between calculated and experimental I-V profiles. The procedure also has been substantiated by examination of representative I-V profiles which were calculated to correspond to the incident beam slightly misaligned from, and exactly aligned with, the surface normal. It then has been inferred from such substanstiation that use of EBA in a LEED analysis reduces the effects of systematic experimental errors caused by minor misalignment of the incident beam, beam divergence, and certain surface morphologies