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Bellissent, R.; Chenevas-Paule, A.; Roth, M.
CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)1982
CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)1982
AbstractAbstract
[en] Small angle neutron scattering measurements have been made on pure, hydrogenated or deuterated samples of amorphous silicon. The scattered intensity from the sputtered films indicate density fluctuations of average radius of gyration of about 125 A. The presence of a ring at 0.22 A-1 on the diffraction pattern obtained from α-Si:H suggests a possible correlation length of about 30 A
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Sep 1982; 4 p; 16. International conference on semi-conductor physics; Montpellier (France); 6 - 10 Sep 1982
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