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Eritsyan, G.N.; Melkonyan, R.A.; Nazaryan, Yu.R.; Oganessyan, A.S.; Sahakyan, A.A.; Tarashchenko, D.T.
Erevanskij Fizicheskij Inst. (USSR)1981
Erevanskij Fizicheskij Inst. (USSR)1981
AbstractAbstract
[en] The reflection spectra of silicon carbide monocrystals of 6H and 15R polytypes are measured in spectral 6.0-9.0 region using the synchrotron radiation as a source. The spectra obtained do not differ much from the optical spectrum of polytype 6H. A characteristic reflection maximum can be found at 7.8 eV, however the reflectance of monocrystals 15R in the longwave part of the spectrum is noticeably higher than that in 6H. The results are compared with the quantum yield measurements
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1981; 6 p; 4 refs.; 2 figs.
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