Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.031 seconds
Johnson, R.T. Jr.; Thome, F.V.; Craft, C.M.
Sandia National Labs., Albuquerque, NM (USA)1983
Sandia National Labs., Albuquerque, NM (USA)1983
AbstractAbstract
[en] The purpose of this report is to present results of a study to evaluate the state-of-the-art and outline needed research on aging of electronics in nuclear power plants. The emphasis is on aging of electronics (e.g., semiconductors, capacitors, resistors) used in safety-related Class 1E instrumentation, particularly those used in harsh environments. Some attention is also given to encapsulants, printed circuit boards and bonds (e.g., solder joints) since they are integral parts of circuits. Four major tasks were addressed in this study and are the subject of this report. These include (1) selecting candidate electronic components for study and review; (2) defining the aging environment and initiating an effort to determine the state-of-the-art in aging degradation; (3) recommending follow-on investigations and research; and (4) outlining the first steps in defining a program on accelerated aging
Primary Subject
Source
Apr 1983; 68 p; SAND--82-2559; Available from NTIS, PC A04/MF A01 - GPO as DE83012696
Record Type
Report
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue