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AbstractAbstract
[en] Germanium and silicon detectors are now widely used for the detection and measurement of x and gamma radiation. However, some analysis situations and spectral regions have heretofore been too complex to deconvolute and interpret by techniques in general use. One example is the L x-ray spectrum of an element taken with a Ge or Si detector. This paper describes some new tools and methods that were developed to analyze complex spectral regions; they are illustrated with examples
Source
Jun 1983; 6 p; American Nuclear Society winter meeting; San Francisco, CA (USA); 30 Oct - 4 Nov 1983; CONF-831047--1; Available from NTIS, PC A02/MF A01 as DE83013585
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