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Maywald, C.; Metz, P.; Rieks, H.H.; Scheer, J.
Annual report of scientific activities 1983 of the HMI, Bereich Kern- und Strahlenphysik1983
Annual report of scientific activities 1983 of the HMI, Bereich Kern- und Strahlenphysik1983
AbstractAbstract
No abstract available
Original Title
Spurenanalytik mit Schweren Ionen
Primary Subject
Source
Hahn-Meitner-Institut fuer Kernforschung Berlin G.m.b.H. (Germany, F.R.). Bereich Kern- und Strahlenphysik; 173 p; 1983; p. 133; Published in summary form only.
Record Type
Report
Report Number
Country of publication
ARGON 40 BEAMS, BACKSCATTERING, CHEMICAL ANALYSIS, DEPTH, ENERGY RESOLUTION, ION BEAMS, ION DETECTION, KRYPTON 86 BEAMS, MASS RESOLUTION, MEV RANGE 100-1000, PIXE ANALYSIS, RECOILS, RUTHERFORD SCATTERING, SENSITIVITY, SPATIAL DISTRIBUTION, SPATIAL RESOLUTION, SURFACE BARRIER DETECTORS, TIME-OF-FLIGHT METHOD, TRACE AMOUNTS, X-RAY DETECTION
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