[en] The results of damage threshold measurements made at LLNL using ultraviolet wavelength laser pulses are reviewed. Measurements were made with pulses from a krypton fluoride laser with wavelength of 248 nm and pulse duration of 20 ns and with Nd-glass laser pulses converted to the third harmonic wavelength of 355 nm with duration of 0.6 ns. Measurements are presented for transparent window materials, crystals and harmonic generation, single layer dielectric films of oxide and fluoride materials and multilayer high reflectivity and antireflective coatings