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Mejer, A.V.; Pshenichnyj, G.A.
Leningradskij Gosudarstvennyj Univ. (USSR)1982
Leningradskij Gosudarstvennyj Univ. (USSR)1982
AbstractAbstract
[en] The method increasing accuracy of the X-ray fluorescent analysis in multicomponent media is suggested in case when interfering element radiation is superposed on characteristic radiation of the element determined on the background of multiscattered source radiation. For such a case, spectra of specimen secondary radiation are measured, the element determined being absent; filler composition is the same, and the interfering element content is different. Then energy ranges are widened, the sections of amplitude distribution of scattered radiation being additionally included. The sections are placed outside of the regions of amplitude distribution of analytical lines of interfering and determined elements so, that relative change of counting rate in every interval equals relative change of counting rate of the analytical line of the elememt determined, when single measuring in terfering element content. On content of the element determined is judged by the ratio of counting rates in the first and the second intervals
Original Title
Sposob rentgenofluorestsentnogo opredeleniya soderzhaniya ehlementa
Primary Subject
Source
9 Jun 1982; 14 p; SU PATENT DOCUMENT 1065748/A/
Record Type
Patent
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