Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.013 seconds
Goncharov, S.M.; Gimel'farb, F.A.; Sidenko, A.M.; Solov'ev, A.D.; Fatyushin, A.M.
Gosudarstvennyj Nauchno-Issledovatel'skij i Proektnyj Inst. Redkometallicheskoj Promyshlennosti, Moscow (USSR)1983
Gosudarstvennyj Nauchno-Issledovatel'skij i Proektnyj Inst. Redkometallicheskoj Promyshlennosti, Moscow (USSR)1983
AbstractAbstract
[en] A method of sample preparation for electron-probe microanalysis of non-luminescent substances is suggested. The method permits to extend the scope of materials analyzed by tungsten, molybdenum, vanadium, germanium, etc. For this puprpose, an yttrium or gadolinium layer 0.5-1.5 μm thick is coated on the sample surface in vacuum as polished, then vacuum diffusion annealing is performed for 1-3 hours at 700-900 deg C. The layer is then oxydized in gaseous medium at the temperature of luminescent layer formation and analyzed by the cathode-luminescence method
Original Title
Sposob podgotovki obraztsa dlya ehlektronno-zondovogo mikroanaliza nelyuminestsiruyushchikh veshchestv
Primary Subject
Source
19 Apr 1983; 6 p; SU PATENT DOCUMENT 1100525/A/
Record Type
Patent
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue