[en] An X-ray fluorescence spectrometric method for the analysis of lutetium oxide is described. The sample in the oxalate form is mixed with boric acid binding material and pressed into a pellet over supporting pellet of boric acid. A Philips PW 1220 wavelength dispersive semiautomatic X-ray fluorescence spectrometer is used for the analysis. The minimum determination limit is 0.002 percent for Y, Er and Yb and 0.005 percent for Tm. Calculations for theoretical minimum detection limits and percent standard deviations at each concentration of the standard are carried out. (author)