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Lattice thermal expansion effects in pure and doped cordierite by time-of-flight neutron diffraction
Predecki, P.K.; Haas, J.; Faber, J. Jr.; Hitterman, R.L.
Denver Univ., CO (USA); Argonne National Lab., IL (USA)1985
Denver Univ., CO (USA); Argonne National Lab., IL (USA)1985
AbstractAbstract
[en] The thermal expansion behavior of pure, Ge-doped and Li-doped hexagonal cordierites with respective compositions: 2Mg0 2Al2O3 5SiO2, 2Mg0 2Al2O3 4SiO2 GeO2, and 2Mg0 (2+x)Al2O3 (5-2x)SiO2 xLi2O with x = .174, was investigated using time-of-flight neutron powder diffraction at temperatures from 22 to 7500C in vacuum. The data were refined in space group P6/mcc using the Rietveld method. The lattice thermal expansion curves of all 3 samples were quite similar. The negative c axis expansion is asociated with (1) displacement of the T2 cations generally toward the c axis channels and (2) changes in the distortion of the coupled T1/M tetrahedra/octahedra in the structure. Both contributions were present in all 3 samples but the first was more dominant in the Ge doped sample. The nature and origin of the distortions in T1 and M are discussed
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Oct 1985; 25 p; 34. annual Denver conference on applications of x-ray analysis; Snowmass, CO (USA); 5-9 Aug 1985; Available from NTIS, PC A02/MF A01; 1 as DE86005547; Portions of this document are illegible in microfiche products.
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