[en] An X-ray fluorescence spectrometric method for the analysis of thulium oxide is described. For the analysis, the sample in oxalate form is mixed with boric acid binding material and pressed into a pellet over a supporting pellet of boric acid. A wavelength dispersive Philips PW 1220 X-ray fluorescence spectrometer is used for the experiments; the minimum determination limits are 0.002per cent for Ho, Lu and Y, 0.005per cent for Dy and Er and 0.01per cent for Yb. Calculations for theoretical minimum detection limits and percent standard deviation at each concentration of the standard are carried out. (author)