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AbstractAbstract
[en] Transmission electron microscopy was used to study amorphized implanted α-Al2O3. The response of the as-implanted amorphous layer to thermal aging varied with annealing tmperature and time. The recrystallization is total and epitaxial at 11900C
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1986; 5 p; Annual joint meeting of the Electron Microscopy of America and the Microbeam Analysis Society; Albuquerque, NM (USA); 10-15 Aug 1986; Available from NTIS, PC A02/MF A01; 1 as DE86009353; Portions of this document are illegible in microfiche products.
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