Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.038 seconds
Iwanczyk, J.S.; Dabrowski, A.J.; Huth, G.C.; Bradley, J.G.; Conley, J.M.; Albee, A.L.
University of Southern California, Marina Del Rey (USA). Inst. of Physics; Jet Propulsion Lab., Pasadena, CA (USA); California Inst. of Tech., Pasadena (USA)1985
University of Southern California, Marina Del Rey (USA). Inst. of Physics; Jet Propulsion Lab., Pasadena, CA (USA); California Inst. of Tech., Pasadena (USA)1985
AbstractAbstract
[en] A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K/sub α/ at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies. 16 refs., 5 figs
Secondary Subject
Source
1985; 5 p; IEEE nuclear science symposium; San Francisco, CA (USA); 23-25 Oct 1985; Available from NTIS, PC A02/MF A01; 1 as DE86011963; Portions of this document are illegible in microfiche products.
Record Type
Report
Literature Type
Conference; Numerical Data
Report Number
Country of publication
BEAMS, DATA, ELECTRON MICROSCOPY, ELEMENTS, ENERGY RANGE, HALIDES, HALOGEN COMPOUNDS, INFORMATION, IODIDES, IODINE COMPOUNDS, KEV RANGE, LEPTON BEAMS, MEASURING INSTRUMENTS, MERCURY COMPOUNDS, METALS, MICROSCOPY, NONMETALS, NUMERICAL DATA, PARTICLE BEAMS, SEMICONDUCTOR DEVICES, SPECTRA, SPECTROMETERS, TRANSISTORS, TRANSITION ELEMENTS
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue