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AbstractAbstract
[en] A high intensity electron-impact x-ray source using a one-dimensional Pierce lens has been built for the purpose of calibrating a bent crystal x-ray spectrometer. This source focuses up to 100 mA of 20-keV electrons to a line on a liquid-cooled anode. The line (which can serve as a virtual slit for the spectrometer) measures approximately 800 μ x 2 cm. The source is portable and therefore adaptable to numerous types of spectrometer applications. One particular application, the calibration of a high resolution (r = 104) time-resolved cyrstal spectrometer, will be discussed in detail
Source
Jun 1986; 8 p; 30. SPIE technical symposium on optics and optoelectronic engineering; San Diego, CA (USA); 17-22 Aug 1986; CONF-860880--9; Available from NTIS, PC A02/MF A01; 1 as DE86012351; Portions of this document are illegible in microfiche products.
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