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Lobachevskij, P.N.; Zamolodchikova, S.Yu.
Joint Inst. for Nuclear Research, Dubna (USSR). Lab. of Nuclear Problems1986
Joint Inst. for Nuclear Research, Dubna (USSR). Lab. of Nuclear Problems1986
AbstractAbstract
[en] A version of irradiated cell inactivation probabilistic model is proposed taking into consideration the sigmoidal form dose dependence of intact cell fraction. Analysis of survival curves and intact cell fraction dose dependences after γ-irradiation of diploid yeast Saccharomyces cerevisiae, carried out on the base of the given approach, allows one to make the following conclusions. Values of the parameter describing the damage realization probability and determining the effect of delayed colony apperance can be calculated unambiquously and more precisely on the base of the given model version than on the base of the original one. The effect of delayed colony appearance is more stable indicator of irradiated diploid yeast response than the survival ratio. Essential variations of survival curve are determined by variations of intact cell fraction dose dependence
Original Title
Veroyatnostnaya model' radiatsionnoj inaktivatsii kletok: uchet sigmoidnoj formy dozovoj zavisimosti nulevogo klassa
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1986; 6 p; 9 refs.; 1 tab.; submitted to the journal Radiobiologiya.
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