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Church, E.L.; Takacs, P.Z.
Army Research and Development Command, Dover, NJ (USA); Brookhaven National Lab., Upton, NY (USA)1986
Army Research and Development Command, Dover, NJ (USA); Brookhaven National Lab., Upton, NY (USA)1986
AbstractAbstract
[en] This paper proposes the use of a simple two-scale model of surface roughness for testing and specifying the topographic figure and finish of synchrotron-radiation mirrors. In this approach the effects of figure and finish are described in terms of their slope distribution and power spectrum, respectively, which are then combined with the system point spread function to produce a composite image. The result can be used to predict mirror performance or to translate design requirements into manufacturing specifications. Pacing problems in this approach are the development of a practical long-trace slope-profiling instrument and realistic statistical models for figure and finish errors
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Mar 1986; 10 p; SPIE technical symposium on applications of artificial intelligence; Orlando, FL (USA); 31 Mar 1986; CONF-860366--10; Available from NTIS, PC A02/MF A01 as DE86014176
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