Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.013 seconds
AbstractAbstract
[en] Detailed depth profiles of hydrogen and oxygen were measured, in thin film samples of a-Si:H produced under varying conditions, using the reaction 1H(19F,α γ)16O in the vicinity of the resonance at E(19F) = 6.417 MeV to profile hydrogen, and resonant elastic α scattering near the resonance at Eα = 3.0359 MeV to profile oxygen. Contrasting results reflecting the different fabrication conditions were obtained and these were correlated with the measured electrical properties
Source
Australian Inst. of Nuclear Science and Engineering, Lucas Heights; 279 p; Nov 1985; p. 19-21; 4. Australian conference on nuclear techniques of analysis; Lucas Heights (Australia); 6-8 Nov 1985
Record Type
Miscellaneous
Literature Type
Conference
Report Number
Country of publication
BEAMS, DIMENSIONS, DISTRIBUTION, ELECTROMAGNETIC RADIATION, ELEMENTS, ENERGY RANGE, EVEN-EVEN NUCLEI, FILMS, IONIZING RADIATIONS, ISOTOPES, LIGHT NUCLEI, MATERIALS, MEV RANGE, NONMETALS, NUCLEI, NUCLEON BEAMS, OXYGEN ISOTOPES, PARTICLE BEAMS, PHYSICAL PROPERTIES, RADIATIONS, SEMIMETALS, STABLE ISOTOPES, TARGETS
Reference NumberReference Number
Related RecordRelated Record
INIS VolumeINIS Volume
INIS IssueINIS Issue