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Bondarenko, V.A.; Kuvaga, I.L.; Upitis, I.V.; Prokof'ev, P.T.; Abele, Ya.Eh.; Skakodub, V.A.
AN Latvijskoj SSR, Riga. Inst. Fiziki1986
AN Latvijskoj SSR, Riga. Inst. Fiziki1986
AbstractAbstract
[en] Time response of the commersial NaI scintillation detector and semiconductor Ge(Li) detector is studied. Time resolution for NaI scintillators 40 and 65 mm in diameter is found to be close to 5 ns, and those for 40-50 cm3 Ge(Li) detectors - 8-10 ns. The dependence of pulse rise time of the semiconductor detectors on various factors is tested. The pulse rise time depends on the point where charge formation takes place and on the subsequent time of charge accumulation. As a rule, the rise time of the pulses which correspond to full energy absorption peaks are shorter than those of the Compton distribution. By the rise time selection technique one is able to improve considerably the energy resolution of imperfect neutron-damaged Ge detectors and their peak-to-Compton ratios
Original Title
Vremennye kharakteristiki promyshlennykh detektorov na osnove germaniya i iodistogo natriya
Source
1986; 15 p; 4 refs.; 7 figs.
Record Type
Report
Literature Type
Numerical Data
Report Number
Country of publication
BASIC INTERACTIONS, DATA, ELASTIC SCATTERING, ELECTROMAGNETIC INTERACTIONS, ELECTRONIC CIRCUITS, FUNCTIONS, GE SEMICONDUCTOR DETECTORS, INFORMATION, INTERACTIONS, LI-DRIFTED DETECTORS, MEASURING INSTRUMENTS, NUMERICAL DATA, RADIATION DETECTORS, RESOLUTION, SCATTERING, SCINTILLATION COUNTERS, SEMICONDUCTOR DETECTORS, SOLID SCINTILLATION DETECTORS, SPECTROSCOPY, TIMING PROPERTIES
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