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AbstractAbstract
[en] The charge state distribution of Xe ions produced by 4.1-8.0 keV synchrotron radiation has been measured by means of a time-of-flight mass spectrometer. It is found that the mean charge of Xe ions resulting from atomic rearrangement following the creation of the inner-shell vacancies in Xe atoms significantly depends on the photon energy and is clearly affected by L-subshell ionisation thresholds. The experimental results are found to be in good agreement with the Monte Carlo calculations. (author)
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Record Type
Journal Article
Literature Type
Numerical Data
Journal
Journal of Physics. B, Atomic and Molecular Physics; ISSN 0022-3700;
; CODEN JPAMA; v. 20(2); p. L31-L36

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