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Fleetwood, D.M.; Beutler, D.E.; Draper, B.L.; Knott, D.; Brown, D.B.; Rosenstock, H.
Sandia National Labs., Albuquerque, NM (USA); Naval Research Lab., Washington, DC (USA)1988
Sandia National Labs., Albuquerque, NM (USA); Naval Research Lab., Washington, DC (USA)1988
AbstractAbstract
[en] The response of MOS capacitors with TaSi/Al and Al electrodes to medium- and low-energy x-irradiation is investigated. Experimentally measured dose-enhancement effects are compared with computer simulations for these structures
Source
1988; 5 p; 25. annual conference on nuclear and space radiation effects; Portland, OR (USA); 12-15 Jul 1988; CONF-880730--2; Available from NTIS, PC A02; 3 as DE88005483
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