[en] The electrical properties of metallic contacts on solid state x-ray detectors can play an important role in determining the overall response and sensitivity of these devices. Rutherford Backscattering (RBS) and Auger electron spectroscopies have been utilized to characterize thin palladium contacts on mercuric iodide (HgI₂) detectors. The RBS measurements were performed at room temperature with the metal contact preventing evaporate loss of the HgI₂ and reducing contamination to the vacuum chamber. Computer simulations of the RBS results indicate that the interface region of a sample with a palladium contact had approximately the ideal stoichiometry but that the palladium film thickness (350 /angstrom/) was less than expected from the deposition conditions. Auger sputter profiling which removes the metal contact ''cap'' was performed with a rapid transfer system equipped with liquid nitrogen cooling to avoid evaporative loss of the sample and reduce vacuum system contamination. This technique indicated significant penetration of Hg and I into the Pd contact for a variety of samples. In many cases, the penetration extended all the way to the surface. For a 600 /angstrom/ contact, approximately two thirds or 400 /angstrom/ of the contact is part of a ''reaction zone'' in which there is strong intermixing of the palladium, mercury, and iodine. In one case, where copper was tried as an electrode, the ''reaction zone'' extended all the way to the surface, and the device failed as a detector. The relationship of the contact stoichiometry to the deposition process and device performance will be discussed. 5 refs., 4 figs