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Della Negra, S.; Depauw, J.; Joret, H.; Le Beyec, Y.; Schweikert, E.A.
Paris-11 Univ., 91 - Orsay (France). Inst. de Physique Nucleaire1987
Paris-11 Univ., 91 - Orsay (France). Inst. de Physique Nucleaire1987
AbstractAbstract
[en] An electron cyclotron resonance ion source was used to study the influence of the incident charge state of keV ions on secondary ion emission. The experiments were run with 18 keV Arn+ (1 < n < 11) beams produced by a minimafios source. Various types of targets were bombarded by the ion beam and the sputtered ionized species were identified by time of flight mass spectrometry. The experimental arrangement is detailed and preliminary results are indicated
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1987; 4 p; Conference on Ion Formation from Organic Solids; Muenster (Germany, F.R.); 21-22 Sep 1987
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Report
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Conference
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