Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.016 seconds
Della-Negra, S.; Depauw, J.; Le Beyec, Y.
Paris-11 Univ., 91 - Orsay (France). Inst. de Physique Nucleaire1987
Paris-11 Univ., 91 - Orsay (France). Inst. de Physique Nucleaire1987
AbstractAbstract
[en] A pulsed ion gun was built for surface analysis of organic and inorganic solid layers. Secondary ion mass analysis is made by time of flight measurements. In the spectrometer, MeV ions from a Cf252 source can also be used to bombard the same targets. The principle of the apparatus is similar to the Manitoba system (Standing et al, 1982), but the Cs ion source (Ionex) and the geometrical arrangement are different. Typical measurement results from experiments using the equipment are illustrated
Source
1987; 4 p; 6. International Conference on Secondary Ion Mass Spectrometry - SIMS VI; Versailles (France); 13-18 Sep 1987
Record Type
Report
Literature Type
Conference
Report Number
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue