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Kortright, J.B.; Ross, P.N.; Melroy, O.R.; Toney, M.F.; Borges, G.L.; Samant, M.G.
Lawrence Berkeley Lab., CA (USA)1989
Lawrence Berkeley Lab., CA (USA)1989
AbstractAbstract
[en] Grazing-incidence x-ray scattering studies of the evolution of electrochemically deposited layers of lead on silver (111) as a function of applied electrochemical potential are presented. Measurements were made with the adsorbed layers in contact with solution in a specially designed sample cell. The observed lead structures are a function of the applied potential and range from an incommensurate monolayer, resulting from underpotential deposition, to randomly oriented polycrystalline bulk lead, resulting from lower deposition potentials. These early experiments demonstrate the ability of in situ x-ray diffraction measurements to determine structures associated with electrochemical deposition. 6 refs., 4 figs
Source
Apr 1989; 6 p; International conference on surface and thin film studies using glancing-incidence x-ray and neutron scattering; Marseille (France); 31 May - 2 Jun 1989; CONF-8905161--1; Available from NTIS, PC A02/MF A01 - OSTI; 1 as DE89013424; Portions of this document are illegible in microfiche products.
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