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Venable, D.D.; Zajic, V.; Lowe, C.W.; Olidapupo, A.; Fogarty, T.N.
Hampton Inst., VA (USA)1989
Hampton Inst., VA (USA)1989
AbstractAbstract
[en] Assistance was provided to the Brookhaven Single Event Upset (SEU) Test Facility. Computer codes were developed for fragmentation and secondary radiation affecting Very Large Scale Integration (VLSI) in space. A computer controlled CV (HP4192) test was developed for Terman analysis. Also developed were high speed parametric tests which are independent of operator judgment and a charge pumping technique for measurement of D(sub it) (E). The X-ray secondary effects, and parametric degradation as a function of dose rate were simulated. The SPICE simulation of static RAMs with various resistor filters was tested
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Feb 1989; 84 p; NASA-CR--184835; NAS--1.26:184835; Available from NTIS, PC A05/MF A01
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Report
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Progress Report
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