[en] We describe instrumentation of a scanning photoelectron microscope (SPEM), which we are presently developing and commissioning at the X1A beamline of the National Synchrotron Light Source (NSLS). This instrument is designed to use the Soft X-ray Undulator (SXU) at the NSLS as a high brightness source to illuminate a Fresnel zone plate, thus forming a finely focused probe, ≤ 0.2μm in size, on the specimen surface. A grating monochromator selects the photon energy in the 400-800 eV range with an energy resolution better than 1 eV. The expected flux in the focus is in the 5 x 10⁷ - 10⁹ photons/s range. A single pass Cylindrical Mirror Analyzer (CMA) is used to record photoemission spectra, or to form an image within a fixed electron energy bandwidth as the specimen is mechanically scanned. As a first test, a 1000 mesh Au grid was successfully imaged with Au 4 f primary photoelectrons, achieving a resolution of about 1μm. 10 refs., 5 figs., 1 tab