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AbstractAbstract
[en] Heavy particle radiation can produce upsets in digital circuits as well as trigger burn out or breakdown in power MOSFETs and MNOS nonvolatile memories. Latch-up may also be stimulated by heavy ions. This report covers work done on the effects of heavy particle radiation on PN junctions, CMOS inverters, CMOS latch, MOSFET and non-volatile memories. 15 refs., 3 figs
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1989; 10 p; Japan Atomic Energy Research Institute symposium; Takasaki (Japan); 6-10 Nov 1989; CONF-8911103--1; CONTRACT AC04-76DP00789; Available from NTIS, PC A02/MF A01 as DE90001679; OSTI; INIS; US Govt. Printing Office Dep
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