[en] Charged prticle detection technique is described, consisting in focusing and rejection of particles by means of focusing and deflecting system electric field effect on them. The invention is aimed at increasing the detection accuracy at the expense of improving time resolution and possibility of its control. This is calculated by a certain rejection regime under which only one particles gets to the detector during a short period. Such a rejection is performed by electric field of a deflecting system, to which constant and pulse voltage a certain amplitude, duration and passage frequency are applied. Time resolution under the application of such rejection technique is no worse than 5 ns. 2 figs