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Kwiatek, W.M.; Long, G.J.; Pounds, J.G.; Reuhl, K.R.; Hanson, A.L.; Jones, K.W.
Brookhaven National Lab., Upton, NY (USA)1989
Brookhaven National Lab., Upton, NY (USA)1989
AbstractAbstract
[en] Spatial distributions and concentrations of trace elements (TE) in the brain are important because TE perform catalytic structural functions in enzymes which regulate brain function and development. We have investigated the distributions of TE in rat cerebellum. Structures were sectioned and analyzed by the Synchrotron Radiation Induced X-ray Emission (SRIXE) method using the NSLS X-26 white-light microprobe facility. Advantages important for TE analysis of biological specimens with x-ray microscopy include short time of measurement, high brightness and flux, good spatial resolution, multielemental detection, good sensitivity, and non-destructive irradiation. Trace elements were measured in thin rat brain sections of 20-micrometers thickness. The analyses were performed on sample volumes as small as 0.2 nl with Minimum Detectable Limits (MDL) of 50 ppb wet weight for Fe, 100 ppb wet weight for Cu, and Zn, and 1 ppM wet weight for Pb. The distribution of TE in the molecular cell layer, granule cell layer and fiber tract of rat cerebella was investigated. Both point analyses and two-dimensional semi-quantitative mapping of the TE distribution in a section were used
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Oct 1989; 7 p; 5. international conference on PIXE and its analytical applications; Amsterdam (Netherlands); 20-26 Aug 1989; CONF-8908165--2; CONTRACT AC02-76CH00016; CONTRACT P41RR01838; ES04040; NTIS, PC A02/MF A01 as DE90003965; OSTI; INIS
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