[en] Neutron or X-ray reflection is like the small angle scattering techniques in that it is applied by non-specialists to a wide range of problems. Magnetism, colloids, polymers, materials science and biological systems all provide potential applications for both techniques. The small angle technique is well established, use of the technique is almost routine, and there are data fitting packages which are widely available and provide basic information such as radii of gyration, molecular weights, correlation lengths, etc. By comparing and contrasting the uses of the two techniques, this contribution adresses the question as to whether similar 'basic' information can be made available from reflection measurements. (orig.)